Application: High performance RF, multi contact/mixed signal probing High performance versatile wafer level correlation probing Single ended broadband/mmWave, THz, source/load pull, RF noise probing
Product features:
Stable+rigid structure - a large-sized rigid structure specifically designed for RF testing, with high stability, making it an ideal choice for RF testing.
No back gap - Spring clearance X-Y-Z, stable probe movement and positioning, no back gap.
Linear motion - precision cross roller guide, X-Y-Z all move in a straight line.
Shockproof structure - The differential head adjuster is located at the end of the probe seat, which can reduce operational vibrations from the hands and maximize the protection of high-value RF
Test probe.
