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  • High precision laser scanning microscope

High precision laser scanning microscope

  • Product Item : 6985
  • Category: optical instrument
  • High precision laser scanning microscope
  • Laboratory instruments
  • biological instruments
  • electronic laboratory instruments,
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The high-precision laser scanning microscope NESSIE is a derivative company of the University of Michigan in the United States that has been dedicated to its development. The innovative design makes it compact in appearance, flexible in components, and adaptable to sample stages of different heights, even low-temperature optical thermostats, achieving low-temperature microscopy imaging. Microscopes can handle a wide wavelength range, and fast grating scanning can obtain a hyperspectral image in a matter of seconds. The special laser path design eliminates beam drift during laser scanning, making it very suitable for integration with the company's fully collinear multifunctional ultrafast spectrometer, achieving powerful material characterization functions. It can not only achieve high-speed and high-precision laser scanning spectra, but also collect multi-dimensional spectral data for sample sites of interest.
Equipment characteristics
Unique optical path design, suitable for integration
The input signal of the high-precision laser scanning microscope NESSIE is a single laser beam, and the output signal is a single backpropagation beam collected from the sample detection point. This optical path design ensures that the backpropagation signal does not drift relative to the input beam when scanning the image, making it very suitable for imaging microscope systems in laser experiments.
Room temperature GaAs quantum well imaging. (a) White light imaging; (b) Laser scanning linear reflectance measurement, 80 MHz laser (5 mW laser output) tuned to GaAs bandgap; (c) Four wave mixing laser scanning imaging revealed subsurface defects that affect the GaAs layer.
Flexibility and stability combined
The high-precision laser scanning microscope NESSIE can be adapted to sample stages of different heights and low-temperature optical thermostats. The special design of its structure can achieve overall improvement of the microscope components to remove objects with heights ranging from 4 "to 8". The gap between the center of the objective lens and the microscope bracket and casing is 5.5 inches, which can accommodate low-temperature optical thermostats of different sizes and shapes.
Installing a low-temperature thermostat under a regular microscope requires an adapter plate, which often leads to instability of the sample stage and affects the quality of collected data. The high-precision laser scanning microscope NESSIE adopts independent support and lifting units, ensuring high flexibility and adjustability while maintaining strict alignment and high stability. It can effectively avoid vibration interference caused by low-temperature thermostats and other equipment, and is crucial for generating high-resolution images in a vibrating environment.
Laser scanning without beam drift
A regular laser scanning microscope generally uses two adjacent X and Y scanning mirrors to achieve laser scanning. Due to both mirrors not being on the image plane of the optical system, the beam drifts during image scanning. The special design of the high-precision laser scanning microscope NESSIE places both the X and Y scanning mirrors on the image plane, and uses a parabolic mirror as a relay system between the scanning mirrors, which can eliminate beam drift on the focal plane behind the objective lens.
Eliminate gradual dizziness
Vignetting is the effect of a decrease in brightness near the edges of a field of view image. In a microscope, vignetting distorts data and reduces the field of view. The installation of scanning mirrors in close proximity is the main reason for introducing the vignetting effect in laser scanning. The special optical path design of the high-precision laser scanning microscope NESSIE can eliminate the influence of vignetting effect on the field of view of the entire microscope objective.

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