--30nm optical signal spatial resolution
Terahertz (THz) light sources have a larger wavelength, typically around 300 microns. Due to the existence of diffraction limits, the optical spatial resolution of THz far-field measurement systems is generally limited to around 150 microns. The accuracy of THz far-field measurement results often fails to meet the needs of material science research, especially in experiments that require nanoscale material distribution research (such as the various components in semiconductor chips: source, drain, gate). The emergence of THz NeaSNOM near-field optical microscopy provides a good solution to this problem.
We have successfully developed an easy-to-use experimental equipment with a spatial resolution of 30nm for the THz system.
Product features/basic parameters
+Better spatial resolution than 30nm
+Common THz light range: 0.1-3THz
+Designed broadband polishing mirror
+THz research can use commercial AFM probes
+THz TDS uses a femtosecond laser light source
+Easy to use and stable
