Portable chip atomic force microscope

ICSPI has upgraded its portable nGauge atomic force microscope (AFM) and launched a new generation of portable atomic force microscope Redux. The Redux Atomic Force Microscope (AFM) not only has the advantages of convenient portability, simple operation, fast scanning speed, and the ability to scan large-sized samples without maintenance, but also can quickly find the measurement location of interest, achieving fast and high-precision measurement of relevant areas. Suitable for various nano characterization application scenarios, from scientific research, higher education to industrial users, such as rapid 3D surface morphology imaging analysis of samples, revolutionary innovative technologies have reduced the complexity of traditional AFM operations and expanded the application scope of traditional AFM!
Suitable for various nano characterization application scenarios
Semiconductor industry
Materials Industry
Nanotechnology
Life Technology
Coatings, polymers, and composite materials, etc
higher education
Product features
Smaller and more portable
The unique AFM micro nano electromechanical chip makes the Redux/nGauge Atomic Force Microscope (AFM) system only the size of a briefcase and portable.
Simpler and easier to use
You only need to click the mouse three times to obtain the nanoscale morphology information of the sample surface, without the need to configure a damping platform.
Step 1: Find the scanning area through the built-in optical microscope;
Step 2: Redux/nGauge helps the scanning probe automatically locate the surface of the sample;
Step 3: Click on scan to obtain surface morphology information of the sample.
Easy maintenance and high cost-effectiveness
The diamond-like needle tip ensures an ultra long lifespan for AFM probes, without the need for tedious needle tip replacement operations and other post maintenance work.
Redux adopts piezoelectric AFM probe technology and durable probe tip (left image). The middle image shows the result of the 215th scan of a probe on the sample, and the right image shows the result of the 1164th scan of the sample