Conductivity Seebeck coefficient scanning probe microscope-PSM II
The conductivity Seebeck coefficient scanning probe microscope is a precision measurement device developed for thermoelectric materials, mainly used to measure the two-dimensional distribution of electric potential and Seebeck coefficient in thermoelectric materials. The integrated and automated design scheme makes the system very convenient to use. The stability and reliability demonstrate the excellent quality of traditional manufacturing industry. The newly launched second-generation conductivity Seebeck coefficient scanning probe microscope (PSM II) has higher positional resolution and measurement accuracy on the basis of the previous generation.
Application field:
1. Uniformity measurement of thermoelectric materials, superconducting materials, fuel cells, conductive ceramics, and semiconductor materials
2. Functional gradient material measurement
3. Observing material degradation effects
4. Monitoring resistance drift of NTC/PTC materials
5. Conduction losses in solid dielectric materials
6. Conductivity loss of cathode materials
7. The decrease in peak temperature and change in resistivity of GMR materials
8. Quality monitoring of samples
