Scanning Probe Microscope Controller-R10

Scanning Probe Microscope Controller-R10

After the successful launch of the revolutionary scanning probe microscope controller R9, its R&D team has grandly released a new generation R10 controller by upgrading its software, hardware, and functionality.
Compared to the R9 controller, the performance improvement of the R10 controller mainly includes:
>The new FPGA firmware architecture enhances configuration flexibility
>More than 60 available data channels are provided for measurement
>Data flow and scanning speed both increased by 5 times
>Optimized high-voltage output circuit board, reducing noise level to 1/4 of R9 controller
>Two scanning probe control systems
>Grid points of any density can be set for graph measurement
Product characteristics of R10 scanning probe microscope controller
Fully integrated SPM control platform: All connections between modes and measurements are made through software in the digital domain, providing great flexibility and signal purity. The obtained graphics hardware and experimental setup system allow for quick and convenient customization.
Digital lock-in amplifier: Two additional PLLs and six lock-in amplifiers can be configured to operate independently or connected together to track multiple harmonics. Can generate and demodulate reference frequencies from<1 Hz to 10 MHz or above. The demodulation bandwidth ranges from 10mHz to 100kHz. The method allows for precise tracking of sidebands, even when the reference frequency moves rapidly.
Feedback loop: Add 9. Calculate the feedback loop at 200 kHz.
Kelvin detection: measuring multi frequency KPFM. Feedback loop measures contact potential. All AC and DC modes are available.
Multi rate data path: A revolutionary approach provides synchronous high-speed (16 bits @ 100 MHz) and high-precision (22 bits @ 25 kHz) measurement and synchronization.
Probe protection device/lock protection device: Time based data acquisition, secondary scanning generator and feedback loop are fast, fault safety prompts are close, and close to 5 detected at the input set point μ Stop within s. Lock the protective device and stop scanning, and within 5 out of range parameters μ Take out the probe within s. Automatically continue scanning after returning to the range.
Time based data collection: All data and events will be captured on a time basis for future inspection. Changes to measurement parameters (such as scanning speed, feedback loop set point, bias voltage) are stored in the data file with sub-pixel accuracy and displayed on the stored image.
Secondary scanning generator and feedback loop: A set of R10 controllers can control two independent scanning systems. This can be a single scanning head with two scanners (large and small range), or it can be two independent scanning heads.
Data security: All data is stored in the HDD at the end of each scanning line to prevent data loss in the event of a power outage. The last 100 files of all data types (terrain, spectrum, FFT, oscilloscope traces) are stored on the hard drive for future analysis.
Microscopic diagnostic tool: Transient recorder: Detects transients of less than 10ns. Transient recorder: 100 MS/s acquisition, lasting for 1 second. 50MHz bandwidth FFT; 4-channel oscilloscope @ 50kHz; Data recorders can record data for up to five days.
Access all I/O signals: configurable control routing and 60+I/O signal acquisition.
IHDL/Inventor SDK: Interactive hardware development language: User defined routines. Supports LabVIEW VIshh, MATLAB, Python, etc. without the need to add software modules.
Built in bias modulation: use as little as 10 μ The sine wave of V directly modulates the output bias DAC. The modulation frequency can reach up to 10 MHz.
Z-position modulation multi frequency modulation and detection: directly modulate the output DAC, with a sine wave of less than 10 pm