UHV PAN low-temperature scanning probe microscope

UHV PAN low-temperature scanning probe microscope

The main features of the Pan type low-temperature scanning probe microscopy analysis system include:
-PAN STM/AFM scanning head volume (2.96 "X1.55")
-Integrated large-scale movement of samples in the X-Y-Z direction (5mmX5mmX10mm)
-The working temperature includes various ranges of low temperature 300mK, RT, VT, and HT
-Built in spring and eddy current damping damping system, in situ needle tip and sample replacement
-Compatible with multiple Flow or Bath type low-temperature thermostats and magnets
-Used in conjunction with RHK's new all digital R9 controller
Suitable for surface science research such as topological insulators, low-temperature superconductivity, surface structure, and electrical measurement.
Compact structure, volume:
Built in shock absorption system, can be placed horizontally or vertically
The Pan type low-temperature scanning probe microscope has an extremely compact structure, with a core size of around 40X70mm; Built in spring and eddy current damping damping system;
According to user requirements, two types of configurations can be provided: horizontal placement and vertical placement; In addition, it is compatible with commonly used low-temperature thermostats and magnets, and provides corresponding integration solutions.
In situ sample and probe replacement:
Easy and fast operation; Reliable Performance
The in-situ replacement of samples and needle tips has always been a concern for users in low temperature and ultra-high vacuum environments. To this end, RHK has opened up a reliable, simple and fast in-situ sample and needle replacement device for Pan type low-temperature scanning probe microscopes, and provided multiple sample and needle placement chambers.
The sample holder used in the Pan type low-temperature scanning probe microscope is flexible and diverse, which can fully meet various experimental requirements, such as in-situ heating, sample peeling, sample bombardment, etc; At the same time, it is also compatible with sample racks equipped in other commercial scanning probe microscopes.
Compatible with various magnets and thermostats
To fully meet the requirements of scientists, RHK has collaborated closely with cutting-edge magnet and thermostat manufacturers to develop a complete system for low-temperature scanning probe microscopy and an independent scanning head module system, providing a complete set of solutions according to user specific requirements.
RHK has integrated the world's advanced all digital scanning probe microscope controller R9 into the Pan type scanning probe microscope, concentrating research and development efforts to launch a noisy R9 scanning control system and IVP-R9 preamplifier.
Main technical parameters:
-Working mode: STM and non-contact AFM
-Temperature range:<300mK; RT; VT; HT
X-Y-Z displacement range: 5mmX5mmX10mm
-Scanning range: 5 μ MX5 μ M (RT)
-Sample size: 10mm x 10mm
-Scanning head size: 40mmX70mm