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Nano-FTIR spectrometer

Nano-FTIR spectrometer

A major scientific challenge in modern chemistry is how to achieve non-destructive chemical composition identification of materials at the nanoscale. Some existing high-resolution imaging technologies, such as electron microscopy or scanning probe microscopy, can partially solve this problem, but their inherent chemical sensitivity is too low to meet the requirements of modern chemical nanoanalysis. On the other hand, infrared spectroscopy has high chemical sensitivity, but its spatial resolution is limited by the diffraction limit of half the wavelength, and can only reach the micrometer level, making it impossible to conduct chemical identification at the nanoscale.
The development of nano-FTIR nanoFourier infrared spectroscopy using its unique scattering type near-field optical technology has made nanoscale chemical identification and imaging possible. This technology combines the high spatial resolution of atomic force microscopy with the high chemical sensitivity of Fourier transform infrared spectroscopy, enabling chemical resolution of almost all materials at the nanoscale. Therefore, a new era of nanomaterials in modern chemical analysis has begun.
The scattering type near-field technology uses interferometric detection to detect the backscattered light when scanning the sample surface with a needle tip, while obtaining the intensity and phase signals of the near-field signal. When using a broadband infrared laser to irradiate the AFM tip, the infrared spectrum in the 10nm area below the tip, namely nano FTIR, can be obtained
The nano FTIR spectrum is highly consistent with the standard FTIR spectrum:
Without using any model correction, the molecular fingerprint features reflected in the near-field absorption spectra obtained by the nano-FTIR Fourier transform infrared spectrometer are in good agreement with those obtained using traditional FTIR spectrometers (as shown in the figure below). This is of great significance in both basic research and practical applications, as researchers can compare the nano-FTIR spectra with data from widely established traditional FTIR spectroscopy databases, thereby achieving rapid and accurate material chemical analysis at the nanoscale. The combination of high sensitivity to chemical composition and ultra-high spatial resolution makes nano-FTIR a unique tool for nanoanalysis.
Main technical parameter configuration:
-Reflective AFM needle tip illumination
-Standard spectral resolution: 6.4/cm-1
-Protected background free detection technology
-Optimization based Fourier transform spectrometer
-Collection rate: Up to 3 spectra/s
-Detection module for high-performance near-field spectroscopic microscopy optimization
-Upgradable spectral resolution: 3.2/cm-1
-Suitable detection range: visible, infrared (0.5-20 µ m)
-Including replaceable beam splitter base



-Suitable for synchrotron radiation infrared light source NEW!!!

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