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  • A non-contact rapid measurement system for the electrical properties of graphene/two-dimensional materials 、

A non-contact rapid measurement system for the electrical properties of graphene/two-dimensional materials 、

  • Product Item : 6495
  • Category: optical instrument
  • A non-contact rapid measurement system for the electrical properties of graphene/two-dimensional materials - ONYX
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The company was founded in 2012 and is a high-tech company that provides high security printing equipment, terahertz non-destructive testing equipment, and personal identity security verification equipment. ONYX is a measurement device launched globally for large-scale terahertz non-destructive characterization of graphene, semiconductor thin films, and other two-dimensional materials. ONYX adopts advanced pulse terahertz time-domain spectroscopy technology to achieve non-destructive and high-resolution, rapid electrical property measurement of large-area graphene and two-dimensional materials from scientific research level to industrial level, providing strong support for graphene and two-dimensional material research and industrialization.
Compared with the traditional four probe measurement method, ONYX non-destructive measurement of sample mass spatial distribution
Compared with Raman, AFM, and SEM, ONYX is able to quickly characterize ultra large area samples
Background Introduction
 typically refers to a frequency of 0 1-10 THz, wavelength at 30 μ Electromagnetic waves between m-3mm, with bands between microwave and infrared, belong to the category of far-infrared and submillimeter waves. This frequency band is the transition zone from macroscopic classical theory to microscopic quantum theory, as well as the transition zone from electronics to photonics. Before the mid-1980s, due to the lack of effective generation and detection methods, scientists had limited understanding and research on the electromagnetic radiation properties of this band, and for a considerable period of time, few people paid attention to it. This band in the electromagnetic spectrum (as shown in the figure below) is used to form far-infrared and submillimeter wave gaps, also known as terahertz gaps.
The notable feature of the terahertz band is its ability to penetrate most dielectric materials (such as plastics, ceramics, pharmaceuticals, insulators, textiles, or wood), opening up a possible new world for non-destructive testing (NDT). Meanwhile, many materials exhibit identifiable frequency fingerprint characteristics at terahertz frequency, enabling qualitative and quantitative research on many materials in the terahertz band. The combination of these two characteristics of terahertz waves makes it a new means of material research. Moreover, its photon energy is low and does not cause ionization, enabling true non-destructive testing.
ONYX working principle
ONYX is a measurement system that can achieve full area non-destructive characterization of graphene, semiconductor thin films, and other two-dimensional materials. It can meet different requirements for testing area from scientific level (mm2) to crystal level (cm2) and industrial level (m2). Compared with other measurement methods for large-area samples, such as the four probe method, ONYX can intuitively obtain the spatial distribution of sample conductivity. Compared with microscopic methods such as Raman, scanning electron microscopy, and transmission electron microscopy, micrometer level spatial resolution can achieve rapid characterization of large-area samples.

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