Large platform differential interference metallographic microscope
- Product Item : 366
- Category:
optical instrument
- Large platform differential interference metallographic microscope
- Laboratory instruments
- biological instruments
- electronic laboratory instruments,
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Large platform differential interference metallographic microscope
1、 The main uses and characteristics of DMM-1200C differential interference metallographic microscope:
The DMM-1200 differential interference metallographic microscope (DIC) adopts a high-quality infinite far optical system, and the differential interference phase contrast microscope is suitable for microscopic observation of various objects. Equipped with a drop beam DIC observation system and a transmission lighting system, an infinitely long flat field achromatic objective, a large field eyepiece, and a polarizing observation device, it has the characteristics of three-dimensional and clear images, beautiful appearance, and easy operation. It is an ideal instrument for research in biology, metallurgy, mineralogy, precision engineering, electronics, and other fields. Differential interference (DIC) observation can be used to obtain high-definition images, making the image contrast better. It is developed for semiconductor wafer detection, solar silicon wafer manufacturing, electronic information industry, and metallurgical industry, and is used as an advanced industrial metallographic microscope; It can be used for bright field observation, falling polarization, DIC observation, and is widely used in factories, research institutions, and universities for the detection and analysis of solar cell silicon wafers, semiconductor wafers, circuit substrates, FPDs, and precision molds.
The DMM-1200C computer-based differential interference metallographic microscope is a high-tech product developed by combining optical microscopy technology, photoelectric conversion technology, and computer imaging technology. It can be used to manually observe metallographic images, as well as conveniently and timely observe metallographic images on a computer. It is also possible to take and record metallographic images at any time, so as to analyze and grade metallographic images. High pixel metallographic photos can also be saved or printed.