Semiconductor/FPD inspection microscope

Semiconductor/FPD inspection microscope
1、 The main uses and characteristics of research-oriented metallographic microscope instruments:
The brand new MCK-12RC semiconductor/FPD inspection microscope supports inspection of 300mm wafers and 17 inch LCD panels, with various turntables of 4, 6, 8, and 12 inches, suitable for inspection of wafers of different sizes. The comprehensive improvement of ergonomic design provides users with a more comfortable, flexible, and fast operating experience.
The MCK-12RC research industrial grade microscope is a new product developed and successfully combined with optical microscopy technology, photoelectric conversion technology, and computer imaging technology. It can be used to manually observe metallographic images, as well as conveniently and timely observe metallographic images on a computer, which can be captured at any time for analysis and grading of metallographic spectra. High pixel metallographic photos can also be saved or printed.
Adjustable elevation observation tube
The 0-35 ° observation angle is adjustable, suitable for users of different heights, reducing the requirements for the work environment, allowing different users to find the appropriate observation angle, reducing discomfort and fatigue caused by long-term work, and greatly improving work efficiency.
New clutch driven loading platform
MCK-12RC adopts a clutch handle, allowing users to flexibly move the platform by pressing the clutch wrench, without the need for prolonged gripping of the handle; Press the clutch button to cancel the quick movement. Avoid hand numbness during prolonged operation and accelerate observation speed. MCK-12RC introduces a precision guide rail transmission mechanism, which moves smoothly and the machine is stable and reliable.
Safe and high-speed electric objective converter
Equipped with forward and reverse gear switching modes, it can quickly and accurately locate to the desired observation magnification, with high precision in repeated positioning. The mechanical switching mode effectively improves the service life of the converter.
Easy to reach buttons, helping you improve work efficiency
The MCK-12RC objective lens and aperture diaphragm adopt a brand new electric control system, with operating buttons located directly in front of the instrument, making it easy for you to reach. The humanized electric design not only avoids frequent manual operation steps, but also makes your detection work more precise and flexible.
Design of shock-absorbing brackets
The body is supported by six end brackets, with a low center of gravity and high stability all metal frame, which has strong seismic resistance and ensures stable image quality.
Rich application areas
MCK-12RC integrates various observation functions such as bright field, dark field, polarization, DIC, etc. Widely used in semiconductor, FPD, circuit packaging, circuit substrates, materials, casting metal ceramic components, precision grinding tools and other testing.