NeaSCOPE nanospectral and imaging system

NeaSCOPE nanospectral and imaging system

The company has launched a new generation of scattering near-field optical microscope (s-SNOM), which is equipped with new technology and expands product functions to meet the diverse experimental needs of customers. Based on scattering core design technology, neoSCOPE significantly improves optical resolution and does not rely on the wavelength of the incident laser. It can provide spectral and near-field optical images with spatial resolution better than 10 nm in the visible, infrared, and terahertz spectral ranges. NeaSCOPE supports both s-SNOM functionality and the combination of nanoinfrared (FTIR), needle enhanced Raman (TERS), ultrafast spectroscopy (Ultrafast), and terahertz spectroscopy (THz) to achieve high-resolution spectroscopy and imaging. Due to its high reliability and repeatability, neoSCOPE has become the preferred research equipment in the field of nanooptics. It has achieved many important scientific research results in many research directions, such as plasmon polaritons, two-dimensional material phonon polarization, semiconductor carrier concentration distribution, infrared characterization of biomaterials, electron excitation and attenuation processes.

Equipment features:
The industry's needle tip enhancement technology provides high-quality nanoscale analytical experimental data.
With diverse functions and high reliability, it has been confirmed by a large number of published articles and has a deep influence in the field of nanooptics. It is an important choice for domestic and foreign research laboratories.
The software is easy to use and provides interactive user guidance function, allowing new users to quickly get started. A streamlined software interface that gradually guides users to easily complete experimental operations.
Adopting modular design, customized configurations are tailored to the user's experimental needs, while also taking into account future upgrade needs, without the need for repeated purchases of hosts.
Basic principle of s-SNOM:
A illuminated particle will form an enhanced light field around it, and this near-field will be altered by nearby samples. This near-field interaction will cause the scattered light band received in the far field to have local optical properties of the sample. When a laser beam (visible, infrared, terahertz) is focused on a standard metal coated AFM tip, a nanofocal point is formed at the tip tip that is several thousand times smaller than the excitation wavelength, and the size is only determined by the tip curvature radius. This nanofocus is not used for local detection of samples, and near-field optical imaging can be obtained by recording the scattered light during the probe scanning process.