Cathode Fluorescence Analysis System - CL-STEM

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Cathode Fluorescence Analysis System - CL-STEM

The achievable signal-to-noise ratio and high spectral resolution of the cathodoluminescence detector. It can help researchers achieve ultra-high resolution image and hyperspectral spectrum detection for single nanoparticles, quantum dots, or atomic defect measurements. It is important to achieve the required signal-to-noise ratio in a short period of time when using STEM for cathodic fluorescence spectroscopy detection, so that you can test more samples in a short period of time. Attolight adopts innovative technology to achieve efficient collection of photons with a wide solid angle over a large area within a distance range of millimeters from the sample, using only one expansion hole on the STEM.

M ö nch 4107 is powerful and efficient. Firstly, the reflector is carefully designed to achieve a curvature radius and miniaturization level; It can adapt to most calibrated STEM devices on the market while maintaining sufficient stiffness and 3 degrees of freedom, allowing for sub millimeter level adjustments. Secondly, M ö nch 4107 directly collects the cathodoluminescence of the sample and couples it into the optical fiber to ensure the strength of the signal reaching the spectrometer. Afterwards, an ultra fast EMCCD camera measures the signal and achieves high spectral resolution, and hyperspectral scanning can be completed within a few seconds. Data can be directly collected and displayed in parallel through software from other technologies (EELS, EDS).

M ö nch 4107 is not a plugin. This is a solution provided by a company with years of professional knowledge in electron microscopy, optics, and spectroscopy. Attolight will promote the design and manufacturing technology used in the development of cathode fluorescence SEM analysis systems to STEM equipment.

The M ö nch 4107 includes a 3-degree-of-freedom fast calibrated fluorescence collection mirror, a fiber-coupled high-resolution spectrometer, a scientific grade high-speed camera for fast hyperspectral collection, and a STEM pole with a scanning module.

M ö nch 4107 has a solid publishing record, which includes reports on nanoplasmons, quantum nanooptics, real-time cathodoluminescence detection of individual quantum wells, and nonlinear detection.

Characteristics of CL-STEM equipment:

From excitation luminescence to detection, the transmission loss of light is small

Constant spectral resolution without loss of intensity.

→ 3-axis submicron electric reflector - collects samples and emits light at any position

Precision design, configured with a 2mm gap between the pole shoe/sample.

→ Equipped with ultrafast cameras and high-precision scanning and collecting mirrors, it can achieve ultraviolet visible near-infrared hyperspectral imaging in milliseconds

Fully compatible with other STEM technologies

HAADF, BF, diffusion, EELS (plug-in detector), EDS, Tomography (scalable detector)

Compatible with Gatan Digital Micrograph software

CL-STEM application areas:

Advanced material properties research, such as:

Nitride semiconductors (GaN, InGaN, AlGaN,...);

III-V group semiconductors (GaP, InP, GaAs,...);

II-VI group semiconductors (CdTe, ZnO,...)

Wide bandgap materials (diamond, AlN, BN)

→ Detect the heterogeneity of the composition of composite materials (such as In enrichment in InGaN materials)

Optical properties associated with microstructure or heterostructure morphology of materials

→ Defect characterization (vacancies, line dislocations, stacking faults,...)

→ Surface plasmon polaritonics

CL-STEM device parameters:

Test mode: Cathode fluorescence hyperspectral mapping

Optical part

Reflective mirror

→ Fiber optic coupler

Spectral collection range 200-1700 nm

→ The signal is achieved through fiber optic decoupling without calibration

The numerical aperture of each optical component matches each other, reducing the loss of light intensity to a minimum

The collected cathode fluorescence signals can be coupled to the user's own optical equipment (such as interferometers, light source injectors, etc.)

Users can quickly replace conductive optical fibers according to their needs

Detector section:

→ Adopting a dispersion spectrometer with 3 grating towers and dual outlets (gratings to be selected by the customer when placing an order)

High speed EMCCD cameras can be selected for detecting the UV Vis band; Alternatively, a high-speed CCD camera can be used to detect InGaAs line array detectors in the UV-NIR band for NIR (optional)

Micro positioning system:

→ 3 degrees of freedom collection mirror to achieve signal collection stroke at any position of the sample: ± 150 (Z), 3 mm (X), 100 mm (Y)

→ Small step size: 500 nm

→ Repeatability (throughout the entire journey): 500 nm

Touch prompt to avoid damaging the extreme boots

System control:

→ 4-channel scanning card: 1 for additional single channel detector, 2 for controlling STEMXY axis scanning, and 1 for controlling STEM electron beam

Detection speed of →: 900Hz (128 * 128 mapping only takes 18s)

→ Control software compatible with Win7

→ Gatan Digital Micrograph software can be used for data collection and visualization

Installation requirements:

There is a space of more than 2mm between the pole shoes and the sample stage (more than 4mm between the upper and lower pole shoes)

The gap between the sample and the carrier is less than 300 μ M