Desktop X-ray absorption fine structure spectrometer

Desktop X-ray absorption fine structure spectrometer

The company has launched a desktop X-ray absorption fine structure spectrometer, which adopts a unique X-ray monochromator design and does not require synchrotron radiation light sources. It achieves X-ray absorption fine structure measurement and analysis in conventional laboratory environments with ultra-high sensitivity and light source quality, achieving element determination, valence state and coordination structure analysis, etc. In addition, the device can also perform X-ray emission spectroscopy (XES), which is essentially a high-energy resolution X-ray fluorescence spectrum (high-resolution XRF) characterization. XAFS and XES can achieve complementary information on the local electronic structure of the sample. Widely used in research fields such as batteries, catalysts, environment, radiochemistry, geology, ceramics, etc.

XAFS/XES device features
-No need for synchrotron radiation light source
-Research level spectrogram effect
-Desktop design for laboratory use
-Can connect external instruments and equipment to control sample conditions
-Can achieve testing of multiple samples or multiple conditions
-Convenient operation and low maintenance cost
XAFS/XES device parameters
X-ray source:
XAFS: 1.2-kW XRD (Mo/Ag)
XES: 100W XRF air-cooled pipe (Pd/W)
Energy range: 4.9-20.5keV
Resolution: 0.5-1.5eV
Sample tower: 8-position automatic sample wheel
Prague Point: 55-85 de