DMM-900C Coating Detection and Analysis System

DMM-900C Coating Detection and Analysis System
1、 The characteristics and applications of the DMM-900C coating detection and analysis system:
The DMM-900C coating detection and analysis system consists of a reflective metallographic microscope DMM-900C and a digital camera. The upright reflection metallographic microscope adopts an excellent infinite distance optical system and modular functional design concept, which can achieve polarization observation, reflection observation, transmission observation, and dark field observation functions. Ideal design that meets ergonomic requirements, making low hand operation more convenient and comfortable. Suitable for microscopic observation of metallographic structure and surface morphology, suitable for electronic, metallurgical, chemical and instrumentation industries, coating and other non-metallic materials, as well as detection and analysis of solar cell silicon wafers, semiconductor wafers, circuit substrates, FPDs, precision molds, etc.
Performance characteristics
1. Equipped with a large field of view eyepiece and an infinitely long flat field achromatic objective (without cover glass), the field of view is large and clear 
2. Coarse and micro coaxial focusing mechanism, adjustable coarse and micro elasticity, with limit locking device, micro grid value: 2 μ M
3. 6V30W halogen lamp with adjustable brightness. The filament direction can be adjusted
4. Three lens tube, can freely switch between normal observation and polarized observation
5. High pixel digital imaging system, computer display imaging is real and clear